Specifications & Features

• Imaging Modes: Supports all standard scanning modes including vibrating (tapping), non-vibrating (contact), phase scanning, Lateral Force Mode (LFM), and force-distance curve measurements.

• Electronics: Controlled by the CS-3230 Ebox, utilizing a 24-bit microcontroller and a 14-bit ADC, effectively providing 22 bits of resolution when combined with 15 stages of gain. 

• Software Integration: Operates using AFM Workshop AFMControl Software , which is built in LabView. Captured files are compatible with open-source processing tools like Gwyddion

• Design Philosophy: Uses a modified tripod flexure piezoelectric scanner and shared components to lower manufacturing and maintenance costs while retaining high-performance nanoscale measurement

Hardware Components

• Light Lever Force Sensor: Uses a laser reflected from the back of the cantilever onto a photodetector to measure nanometer-scale bending caused by surface interactions. 

• Optical Microscope: Assists in locating features on your substrate, aligning the light lever force sensor, and executing tip-approaches.

• Z-Motor & Scanners: Includes a linearized high-resolution Z-motor for vertical translation and linearized piezoelectric scanners for high-accuracy X and Y movement